Insulation verification using low voltage and high current sensitivity
Abstract
Classic approach for determining insulating resistance by using commercial testers is not reliable for testing different types of insulation especially for cables with one conductor and nanoelectronic oxide-based devices (nanotransistors). Alternative low-voltage method for measuring insulation resistance based on strongly increased current sensitivity is proposed in this paper. The proposed method of measuring insulation resistance at low voltages is realized by using a high sensitivity Keithley SMU 2612 unit. Verification of proposed method is made by measuring insulation resistance of medical Corkscrew Electrode and gate oxide resistance for nano-scaled MOSFET. Finally, results of measuring insulation resistance obtained by commercial testers and proposed method in the verification process are compared.
